Tungsten’s unique physical properties—such as high melting point and low thermal expansion—make it essential for demanding industrial applications. However, trace contaminants can negatively impact grain growth and overall material performance. To ensure product quality during primary production, recycling, and manufacturing, precise elemental analysis is critical. This report demonstrates how 22 trace elements in high-purity tungsten were successfully analyzed using the SPECTROGREEN MS ICP-MS analyzer.
The SPECTROGREEN MS ICP-MS delivers robust performance for routine elemental analysis, offering high sensitivity, stability, and streamlined operation. Its collision/reaction cell technology effectively reduces polyatomic interferences, while the advanced Quadrupole Digital Sequencer and dual-stage detector enable fast switching and a wide dynamic range. Combined with intuitive software and built-in audit trail features, the system supports compliant, traceable workflows for laboratories focused on metal analysis.
Key Benefits:
- Reliable detection of trace elements in high-purity tungsten using ICP-MS
- Simplified routine operation with automated tuning and intuitive software
- High accuracy and compliance support for regulated laboratory environments
Learn more in this informative ICP-MS application report!