Copper cathodes used in industrial applications must meet stringent purity standards, as even trace levels of impurities like selenium or bismuth can compromise conductivity. This application report presents a robust method for elemental analysis of copper cathodes, focusing on the detection of 18 trace elements that may affect product quality. The study outlines a streamlined sample preparation process and demonstrates excellent linearity and accuracy across all measured elements, ensuring reliable results for quality control in copper production.
The analysis was conducted using ICP-MS technology, specifically the SPECTROGREEN MS system, which combines high sensitivity with operational simplicity. Its collision/reaction cell effectively mitigates polyatomic interferences, while the dual-stage detector and Quadrupole Digital Sequencer enable fast, stable measurements across a wide dynamic range. The system’s intuitive software supports efficient workflows and full traceability, making it ideal for routine laboratory use.
Key benefits:
- Reliable detection of trace elements in high-purity copper using ICP-MS
- Simplified workflows with automated tuning and intuitive software
- High accuracy and reproducibility validated through spike recovery tests
Download the full application report to explore how ICP-MS can enhance your copper cathode quality assurance processes.