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Application Brief
Analysis of Electroless Nickel Plating Baths Using ICP-OES With DSOI
Electroless nickel plating is widely used across industries such as automotive, aerospace, and electronics for its ability to enhance surface properties like corrosion resistance and hardness. The stability and performance of these plating baths are highly dependent on their chemical composition. Accurate elemental analysis is therefore essential to detect impurities, maintain bath consistency, and extend operational lifespan.
This application report demonstrates how inductively coupled plasma optical emission spectrometry (ICP-OES) with Dual Side-On Interface (DSOI) plasma observation enables precise, simultaneous detection of major and trace elements in complex plating matrices. The method ensures high sensitivity, excellent matrix tolerance, and minimal sample preparation—making it ideal for routine quality control in demanding environments. The study also highlights the successful determination of stabilizing elements such as bismuth and antimony, offering a safer alternative to traditional mercury-based techniques.
The SPECTROGREEN ICP-OES system delivers robust performance through its innovative DSOI technology, providing enhanced detection limits and reliable results across a broad elemental range.
Key benefits
- Achieve high-precision elemental analysis in electroless nickel plating baths
- Detect trace impurities and stabilizers with excellent sensitivity and accuracy
- Improve bath longevity and process efficiency with minimal sample handling
Download the full application report now to explore how SPECTROGREEN ICP-OES can optimize your plating bath analysis.
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Analysis of Electroless Nickel Plating Baths Using ICP-OES With DSOI
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